
Process and environmental monitoring
19" scanning mobility particle sizer and counter
SMPS+C system in 19” rack-design, available as SMPS+C 5420 CEN with a size range of 10 nm to 1,090 nm for full compliance with CEN/TS 17434:2020 or as model SMPS+C 5420 version with M DMA for a size range of 5 nm to 350 nm. It is designed for unattended 24/7 real-time monitoring of UFP in ambient air.
Applicable Standards
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